钻石
材料科学
中间层
电子设备和系统的热管理
光电子学
工程物理
热的
硅
炸薯条
机械工程
电子工程
纳米技术
电气工程
冶金
工程类
图层(电子)
蚀刻(微加工)
物理
气象学
作者
Yi Zhong,Shuchao Bao,Yimin He,Ran He,Xiaofan Jiang,Hengbo Zhang,Yuchun Zhao,Yang Wang,Lu Zhao,Wenbiao Ruan,Yu Chen,Mingchuan Zhang,Daquan Yu
标识
DOI:10.1109/led.2024.3351990
摘要
Thermal management poses a critical challenge in the design of modern electronic packages. This letter presents a diamond-on-chip-on-glass interposer (DoCoG) technology that incorporates polycrystalline diamond heat-spreader substrates known for their exceptional thermal conductivity. These diamonds are directly bonded to the back-side of silicon chips on a glass interposer, resulting in markedly enhanced cooling performance. The junction-to-ambient thermal resistance dropped by 28.5% due to the integration of diamond. The creation of such multi-stacked DoCoG integration and efficient cooling necessitates a diamond/chip connection that combines a minimal bonding thermal budget, high working temperature, and low thermal boundary resistance. To address this challenge, the study proposes a low-temperature bonding technique through nanolayer Cu/Au recrystallization. The effects of bonding voids on overall cooling performance were investigated. These results represent significant progress toward universal approaches for the viable integration of high-performance coolers into electronic packages, potentially enabling applications that are currently constrained by thermal limitations in heterogeneous integrations.
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