材料科学
退火(玻璃)
能量转换效率
光电子学
快速热处理
功率密度
纳米技术
硅
化学工程
复合材料
功率(物理)
物理
量子力学
工程类
作者
Zhengjie Xu,Lanqin Huang,Yue Jiang,Zhuoxi Li,Cong Chen,Zijun He,Jiayan Liu,Yating Fang,Kai Wang,Guofu Zhou,Jun‐Ming Liu,Jinwei Gao
标识
DOI:10.1021/acsami.2c11488
摘要
The SnO2 electron transport layer (ETL) for perovskite solar cells (PSCs) has been recognized as one of the most reported protocols due to its processing convenience, high reproducibility, and excellence in device performance. To date, the thermal annealing (TA) process is still an essential step for a high-quality SnO2 ETL to reduce the surface trap density. This however could restrict its processing with high thermal energy input and set a barrier to the easiness of manufacturing such as processing under room-temperature conditions. Herein, we report a thermal annealing-free (TAF) SnO2 ETL by an alternative UV-ozone (UVO) treatment. This technique simultaneously endows the SnO2 ETL with a deeper valence band maximum (EVB) and lower defect density. Furthermore, with this SnO2 ETL, a power conversion efficiency (PCE) of 21.46 and 22.26% was achieved based on MAPbI3 and Cs0.05(FA0.85MA0.15)0.95Pb(I0.85Br0.15)3 absorbers, respectively. Importantly, a fully room-temperature-processed (RTP) PSC based on the TAF-SnO2 ETL has been demonstrated with a PCE of 20.88% on a rigid substrate and 15.92% on a flexible substrate, which are the highest values for RTP solar cells.
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