响应度                        
                
                                
                        
                            光电探测器                        
                
                                
                        
                            光电子学                        
                
                                
                        
                            光探测                        
                
                                
                        
                            材料科学                        
                
                                
                        
                            异质结                        
                
                                
                        
                            紫外线                        
                
                                
                        
                            量子效率                        
                
                                
                        
                            光学                        
                
                                
                        
                            比探测率                        
                
                                
                        
                            物理                        
                
                        
                    
            作者
            
                Urvashi Varshney,Anuj Sharma,Lalit Goswami,J.S. Tawale,Govind Gupta            
         
                    
            出处
            
                                    期刊:Vacuum
                                                         [Elsevier BV]
                                                        日期:2023-08-31
                                                        卷期号:217: 112570-112570
                                                        被引量:12
                                 
         
        
    
            
            标识
            
                                    DOI:10.1016/j.vacuum.2023.112570
                                    
                                
                                 
         
        
                
            摘要
            
            We have reported unique β-Ga2O3 nanoscale-strips (β-Ga2O3-NSS) morphology on epitaxial Gallium nitride film by thermal oxidation and fabricated heterostructure based self-powered photodetector (PD) operable from 230 nm to 800 nm (UVC to Vis) broad spectral range. The device demonstrates an ultrahigh responsivity of 5.8 × 103 mAW−1 under 266 nm illuminations at zero bias. The developed broadband photodetector at zero applied bias exhibits excellent responsivity of 2600, 56, and 450 mAW−1 under light illuminations of 355 nm, 455 nm, and 532 nm, respectively. In addition, the device also shows very high responsivity (1.6 × 105 mAW−1) with low noise equivalent power (10−13 WHz−1/2) and excellent external quantum efficiency (104%) under the bias of 5 V at 266 nm. The outstanding performance of the developed device is attributed to the light-trapping geometry of the β-Ga2O3-nanoscale-strips. The simple architecture of the device opens up new avenues for the fabrication of the next generation of Ga2O3-based broadband photodetection devices.
         
            
 
                 
                
                    
                    科研通智能强力驱动
Strongly Powered by AbleSci AI