光刻胶
深反应离子刻蚀
微电子机械系统
平版印刷术
薄脆饼
材料科学
蚀刻(微加工)
反应离子刻蚀
光刻
分辨率(逻辑)
投影(关系代数)
X射线光刻
抵抗
光电子学
干法蚀刻
纳米技术
计算机科学
人工智能
图层(电子)
算法
作者
Sebastian Schermer,Christian Helke,Danhe Song,Danny Reuter,Harald Kühn
标识
DOI:10.1109/ssi56489.2022.9901437
摘要
In this paper, we are using high-resolution projection lithography together with AZ 10XT thick photoresist to realize an etching mask, which can be used for deep reactive ion etching (DRIE). With a design of experiment (DoE) suitable parameters for a full wafer level process are investigated. Structures with different size from 0.5 μm to 5 μm are used to find the highest aspect ratios for MEMS-applications.
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