商标
技术变革
专利分析
分布(数学)
技术进化
业务
产业组织
技术预测
知识产权
计算机科学
数据科学
数学
操作系统
数学分析
人工智能
作者
Jeongeun Byun,Tae-Eung Sung,Hyunwoo Park
标识
DOI:10.1080/09537325.2017.1297397
摘要
ABSTRACT Discussions on the patterns of technological innovation have significant implications in terms of the efficient distribution of national R&D resources and the establishment of corporate managerial strategies. This study is focused on calculating and analysing technology cycle time (TCT) by technological area based on patent data that can be used as easily accessible objective indicators for the purpose of modelling the patterns of technological innovation by period and technological area. The main technological areas handled by the study include medical science, vehicles, metallurgy, and computing. Of the patent data registered with the United States Patent and Trademark Office from 1990 to 2014, International Patent Classification sub-class codes representing each technological area were selected to collect patent data, and to generate TCT statistics every five years. The TCT statistics generated is interpreted as the technological life cycle, to be used in modelling technological innovation patterns individualised by technology and period.
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