Analytical model for the diode saturation current of point-contacted solar cells

饱和电流 二极管 薄脆饼 饱和(图论) 速度饱和 太阳能电池 材料科学 载流子寿命 机械 计算物理学 物理 光电子学 电压 数学 量子力学 组合数学 MOSFET 晶体管
作者
Heiko Plagwitz,Rolf Brendel
出处
期刊:Progress in Photovoltaics [Wiley]
卷期号:14 (1): 1-12 被引量:53
标识
DOI:10.1002/pip.637
摘要

Progress in Photovoltaics: Research and ApplicationsVolume 14, Issue 1 p. 1-12 Research Analytical model for the diode saturation current of point-contacted solar cells H. Plagwitz, Corresponding Author H. Plagwitz [email protected] Institut für Solarenergieforschung Hameln/Emmerthal (ISFH), Am Ohrberg 1, D-31860 Emmerthal, GermanyInstitut für Solarenergieforschung GmbH Hameln/Emmerthal (ISFH), Am Ohrberg 1, D-31860 Emmerthal, Germany.===Search for more papers by this authorR. Brendel, R. Brendel Institut für Solarenergieforschung Hameln/Emmerthal (ISFH), Am Ohrberg 1, D-31860 Emmerthal, GermanySearch for more papers by this author H. Plagwitz, Corresponding Author H. Plagwitz [email protected] Institut für Solarenergieforschung Hameln/Emmerthal (ISFH), Am Ohrberg 1, D-31860 Emmerthal, GermanyInstitut für Solarenergieforschung GmbH Hameln/Emmerthal (ISFH), Am Ohrberg 1, D-31860 Emmerthal, Germany.===Search for more papers by this authorR. Brendel, R. Brendel Institut für Solarenergieforschung Hameln/Emmerthal (ISFH), Am Ohrberg 1, D-31860 Emmerthal, GermanySearch for more papers by this author First published: 15 September 2005 https://doi.org/10.1002/pip.637Citations: 47AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Abstract Point-contacted solar cells exhibit three-dimensional transport effects due to a spatially inhomogeneous surface recombination. Complex multi-dimensional finite element simulations are commonly applied to model such devices. This paper presents an empirical analytic equation for the diode saturation current of a point-contacted base of a solar cell that accounts for three-dimensional transport. The input parameters of the model that characterize the back surface are: recombination velocity at the contacts; recombination velocity between the contacts; fraction of surface area covered by the contacts; and the contact spacing. We test this model experimentally by conducting spatially resolved minority-carrier lifetime measurements on silicon wafers with point contacts of various sizes and spacings. The diode saturation currents derived from the lifetime measurements agree with the values predicted by the analytic model. Copyright © 2005 John Wiley & Sons, Ltd. REFERENCES 1 Green MA, Blakers AW, Zhao J, Milne AM, Wang A, Dai X. Characterization of 23-percent efficient silicon solar cells. IEEE Transactions on Electron Devices 1990; 37: 331–336. 2 Aberle A, Warta W, Knobloch J, Voss B. Surface passivation of high efficiency silicon solar cells. Proceedings of the 21st IEEE Photovoltaic Specialists Conference, IEEE, New York, 1990; 233–238. 3 Zhao J, Wang A, Green MA. 24·5% efficiency silicon PERT cells on MCZ substrates and 24·7% efficiency PERL cells on FZ substrates. Progress in Photovoltaics: Research and Applications 1999; 7: 471–474. 4 Glunz S. New concepts for high-efficiency silicon solar cells. Technical Digest of the 14th International Photovoltaic Science and Engineering Conference, Chulangkorn University, Bangkok, 2004; 631–634. 5 DESSIS. Simulation package from Integrated Systems Engineering AG, Zurich, Switzerland. 6 Rau U. Three dimensional simulation of the electrical transport in high efficiency solar cells. Proceedings of the 12th European Photovoltaic Solar Energy Conference, R Hill, W Palz, P Helm (eds). Stephens: Bedford, 1994; 1350–1353. 7 Fischer B. 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Nondestructive technique to measure bulk lifetime and surface recombination velocities at the two surfaces by infrared absorption due to pulsed optical excitation. Journal of Applied Physics 1992; 72: 141–146. 21 Schöfthaler M. Transiente Mikrowellenreflexion zur kontaktlosen Trägerlebensdauer in Silizium für Solarzellen. Shaker: Aachen, 1995. 22 Sproul AB, Green MA, Stephens AW. Accurate determination of minority carrier- and lattice scattering-mobility in silicon from photoconductance decay. Journal of Applied Physics 1992; 72: 4161–4171. 23 Kerr MJ, Cuevas A. General parametrization of Auger recombination in crystalline silicon. Journal of Applied Physics 2002; 91: 2473–2480. 24 Altermatt PP, Schenk A, Geelhaar F, Heiser G. Reassessment of the intrinsic carrier density in crystalline silicon in view of band-gap narrowing. Journal of Applied Physics 2003; 93: 1598–1604. 25 Zhao J. Recent advances of high-efficiency single crystalline silicon solar cells in processing technologies and substrate materials. Solar Energy Materials 2004; 82: 53–64. Citing Literature Volume14, Issue1January 2006Pages 1-12 ReferencesRelatedInformation
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