Measurement in-plane deformations in electronic speckle pattern interferometry using phase-shifting modulated by polarization

We propose to combine electronic speckle pattern interferometry with polarizing phase-shifting techniques to measure in-plane displacement fields. We present the technical and theoretical procedures for its implementation, added with the necessary calibration procedures employing a commercial polarimeter. Finally, we tested our proposal experimentally using a two-phase step algorithm to measure in-plane displacements on a latex sample.