电源抑制比
阈下传导
阈值电压
MOSFET
电气工程
晶体管
CMOS芯片
材料科学
电压
工艺角
光电子学
过驱动电压
负偏压温度不稳定性
电子工程
计算机科学
工程类
放大器
作者
Jhon Gomez,Hamilton Klimach,Eric Fabris,Oscar E. Mattia
标识
DOI:10.1145/2800986.2801009
摘要
This work presents a high PSRR nano-watt resistorless threshold voltage (VT0) monitor circuit that can be used in temperature sensors, voltage and current references, radiation dosimeters and other applications such as fabrication process monitoring and verification. In this circuit design the MOS transistors operate in subthreshold and near-threshold regimes, the circuit analysis is based on a current-voltage relationship derived from a continuous physical MOSFET model, valid from weak to strong inversion. The bias condition is established from the equilibrium between two selfcascode cells operating at different inversion levels, and the high PSRR results from a high gain feedback path. The circuit is MOSFET-only, and can be implemented in any standard digital CMOS process. Post-layout simulations show that it operates with less than 1 V of power supply, consuming only tens of nW, and resulting in a VT0 error lower than 1%, when compared to its modeling value, for a -40 to +125°C temperature range. A very high rejection to VDD variation is achieved in this design, with PSRR lower than -63.9 dB at 100 Hz, and a line sensitivity lower than 252 ppm/V was found for a supply range from 1 V to 3 V. Monte-Carlo simulations are presented to evaluate the fabrication variability sensitivity, presenting a maximum error of 4% for a 3σ spread range. The circuit area is very small, around 0.0047 mm2 including the start-up stage.
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