材料科学
光电子学
带隙
宽禁带半导体
半导体
异质结
功率半导体器件
工程物理
半导体器件
电场
结温
热的
电压
电气工程
纳米技术
工程类
物理
图层(电子)
量子力学
气象学
作者
J.L. Hudgins,G. Simin,Enrico Santi,M.A. Khan
标识
DOI:10.1109/tpel.2003.810840
摘要
An advantage for some wide bandgap materials, that is often overlooked, is that the thermal coefficient of expansion (CTE) is better matched to the ceramics in use for packaging technology. It is shown that the optimal choice for uni-polar devices is clearly GaN. It is further shown that the future optimal choice for bipolar devices is C (diamond) owing to the large bandgap, high thermal conductivity, and large electron and hole mobilities. A new expression relating the critical electric field for breakdown in abrupt junctions to the material bandgap energy is derived and is further used to derive new expressions for specific on-resistance in power semiconductor devices. These new expressions are compared to the previous literature and the efficacy of specific power devices, such as heterojunction MOSFETs, using GaN are discussed.
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