发光二极管
材料科学
光电子学
紫外线
GSM演进的增强数据速率
量子效率
反射器(摄影)
波长
钝化
光学
纳米技术
光源
物理
图层(电子)
电信
计算机科学
作者
Shunpeng Lu,Jiangxiao Bai,Hongbo Li,Ke Jiang,Jianwei Ben,Dabing Li,Zi‐Hui Zhang,Xiaojuan Sun,Dabing Li
出处
期刊:Journal of Semiconductors
[IOP Publishing]
日期:2024-01-01
卷期号:45 (1): 012504-012504
被引量:3
标识
DOI:10.1088/1674-4926/45/1/012504
摘要
Abstract 240 nm AlGaN-based micro-LEDs with different sizes are designed and fabricated. Then, the external quantum efficiency (EQE) and light extraction efficiency (LEE) are systematically investigated by comparing size and edge effects. Here, it is revealed that the peak optical output power increases by 81.83% with the size shrinking from 50.0 to 25.0 μ m. Thereinto, the LEE increases by 26.21% and the LEE enhancement mainly comes from the sidewall light extraction. Most notably, transverse-magnetic (TM) mode light intensifies faster as the size shrinks due to the tilted mesa side-wall and Al reflector design. However, when it turns to 12.5 μ m sized micro-LEDs, the output power is lower than 25.0 μ m sized ones. The underlying mechanism is that even though protected by SiO 2 passivation, the edge effect which leads to current leakage and Shockley-Read-Hall (SRH) recombination deteriorates rapidly with the size further shrinking. Moreover, the ratio of the p-contact area to mesa area is much lower, which deteriorates the p-type current spreading at the mesa edge. These findings show a role of thumb for the design of high efficiency micro-LEDs with wavelength below 250 nm, which will pave the way for wide applications of deep ultraviolet (DUV) micro-LEDs.
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