锌黄锡矿
材料科学
光电子学
开路电压
异质结
铟
能量转换效率
载流子寿命
光伏系统
氧化铟锡
硫化镉
捷克先令
薄膜
太阳能电池
电压
纳米技术
硅
冶金
电气工程
工程类
作者
Zhenghua Su,Guangxing Liang,Ping Fan,Jingting Luo,Zhuanghao Zheng,Zhigao Xie,Wei Wang,Shuo Chen,Juguang Hu,Yadong Wei,Chang Yan,Jialiang Huang,Xiaojing Hao,Fangyang Liu
标识
DOI:10.1002/adma.202000121
摘要
Abstract Kesterite Cu 2 ZnSnS 4 is a promising photovoltaic material containing low‐cost, earth‐abundant, and stable semiconductor elements. However, the highest power conversion efficiency of thin‐film solar cells based on Cu 2 ZnSnS 4 is only about 11% due to low open‐circuit voltage and fill factor mainly caused by antisite defects and unfavorable heterojunction interface. In this work, a postannealing procedure is proposed to complete a Cd‐alloyed Cu 2 ZnSnS 4 device. The postannealing to complete the device significantly enhances the performance of the indium tin oxide and promotes the moderate interdiffusion of elements between the layers in the device. As a result of the diffusion of Cu, Zn, In, and Sn, the interfacial electron and hole densities are improved, leading to the achievement of a suitable band alignment for carrier transport. The postannealing also reduces the interface traps and deep‐level defects, contributing to decreased nonradiative recombination. Therefore, the open‐circuit voltage and fill factor are both improved, and an efficiency over 12% for pure sulfide‐based kesterite thin‐film solar cells is obtained.
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