拉曼光谱
拉曼散射
X射线拉曼散射
光子
各向异性
材料科学
声子
背景(考古学)
各向同性
相干反斯托克斯拉曼光谱
光谱学
极化(电化学)
分子物理学
光学
物理
化学
凝聚态物理
物理化学
古生物学
生物
量子力学
作者
Jungcheol Kim,Jae‐Ung Lee,Hyeonsik Cheong
标识
DOI:10.1088/1361-648x/ab8848
摘要
Raman spectroscopy has been established as one of the core experimental tools to study two-dimensional materials (2DMs) including graphene, black phosphorus, transitional metal chalcogenides, and other layered materials. If the polarization of the incident photons and the scattered photons are carefully controlled, the selection rules for the Raman scattering from phonon modes allow accurate mode assignments, which is not always possible in Raman scattering measurements using unpolarized light. Furthermore, polarized Raman spectroscopy can be used to determine the crystallographic orientation of isotropic 2DMs with in-plane strain or anisotropic 2DMs. This review explains the basics of polarized Raman spectroscopy, especially in the context of 2DMs research, and survey some of the most important applications of polarized Raman spectroscopy in isotropic and anisotropic 2DMs studies.
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