黑磷
离解(化学)
降级(电信)
化学
图层(电子)
从头算
氧化还原
光化学
化学物理
化学工程
材料科学
纳米技术
无机化学
光电子学
物理化学
有机化学
计算机科学
工程类
电信
作者
Qionghua Zhou,Qian Chen,Yilong Tong,Jinlan Wang
标识
DOI:10.1002/anie.201605168
摘要
Abstract The environmental instability of single‐ or few‐layer black phosphorus (BP) has become a major hurdle for BP‐based devices. The degradation mechanism remains unclear and finding ways to protect BP from degradation is still highly challenging. Based on ab initio electronic structure calculations and molecular dynamics simulations, a three‐step picture on the ambient degradation of BP is provided: generation of superoxide under light, dissociation of the superoxide, and eventual breakdown under the action of water. The well‐matched band gap and band‐edge positions for the redox potential accelerates the degradation of thinner BP. Furthermore, it was found that the formation of P‐O‐P bonds can greatly stabilize the BP framework. A possible protection strategy using a fully oxidized BP layer as the native capping is thus proposed. Such a fully oxidization layer can resist corrosion from water and leave the BP underneath intact with simultaneous high hole mobility.
科研通智能强力驱动
Strongly Powered by AbleSci AI