增长率
晶体生长
Crystal(编程语言)
焊剂(冶金)
电阻和电导
材料科学
电阻率和电导率
分析化学(期刊)
化学
通量法
结晶学
单晶
冶金
复合材料
电气工程
色谱法
几何学
工程类
计算机科学
程序设计语言
数学
作者
Ricksen Tandryo,Koichi Itozawa,Kosuke Murakami,Hitoshi Kubo,Masayuki Imanishi,Shigeyoshi Usami,Mihoko Maruyama,Masashi Yoshimura,Yusuke Mori
标识
DOI:10.1016/j.jcrysgro.2023.127292
摘要
Monitoring the GaN crystal growth process in the Na-flux method has been difficult due to the challenging growth process, namely high temperature and high pressure and corrosive nature of Ga and Na. This paper describes the unique method to monitor GaN crystal growth by measuring the electrical resistance of Ga-Na solution. We found that the electrical resistance of Ga-Na solution decreased along with the crystal growth. Furthermore, the decreasing rate of resistance is proportional to growth pressure, which influences the growth rate. During the growth process, Ga in the solution is consumed, reducing the Ga/Na ratio of the Ga-Na solution. The compositional shift toward Na-rich resulted in the decrease of electrical resistance.
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