材料科学
结晶度
拉曼光谱
微观结构
无定形固体
脉冲激光沉积
基质(水族馆)
扫描电子显微镜
薄膜
结晶
分析化学(期刊)
结晶学
光学
化学工程
复合材料
纳米技术
化学
色谱法
海洋学
物理
地质学
工程类
作者
Y.S. Zou,Y.C. Zhang,Dong Lou,H.P. Wang,Long Gu,Yuhang Dong,Kai Dou,Xiufeng Song,Haibo Zeng
标识
DOI:10.1016/j.jallcom.2013.08.166
摘要
Tungsten oxide (WO3) films were prepared on Si (1 0 0) and fused silica substrates by pulsed laser deposition (PLD). The effects of substrate temperature on the morphology, microstructure and optical properties of WO3 films were investigated by scanning electron microscopy, atomic force microscopy, X-ray diffraction, Raman spectra and UV–visible spectrophotometer. It was found that the microstructure, morphology and optical properties strongly depend on the substrate temperature. The X-ray diffraction and Raman results indicate that the amorphous WO3 films are obtained at substrate temperatures below 200 °C whereas the films grown above 300 °C exhibit predominantly (0 0 2) plane orientation, representing the monoclinic structure. The surface roughness, film crystallinity and grain size of the films increase with increasing substrate temperature. The films prepared at substrate temperatures ranging from 300 to 600 °C exhibit high averaged transparency over 60% in the visible region. The optical band gaps of the films are found to decrease monotonically from 3.22 to 3.05 eV as the substrate temperature increases from 200 to 600 °C due to the crystallization of deposited WO3 film.
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