MOSFET
光电子学
材料科学
蚀刻(微加工)
薄脆饼
阈值电压
二极管
硅
电子工程
电气工程
电压
晶体管
纳米技术
工程类
图层(电子)
作者
Jiabin Yan,Jinlong Piao,Yongjin Wang
出处
期刊:IEEE Electron Device Letters
[Institute of Electrical and Electronics Engineers]
日期:2020-01-01
卷期号:41 (1): 76-79
被引量:14
标识
DOI:10.1109/led.2019.2952905
摘要
This letter proposes an enhancement mode MOSFET on GaN-on-silicon LED epitaxial wafer for the first time. The fabrication processes of the MOSFET are fully compatible with InGaN/GaN multiple-quantum-wells (MQWs) diode and include no ion implantation or additional epitaxial growth. Gate-recess structure is formed by well-controlled etching to define the channel area. The bottom and side wall of the recess are fully covered by the gate metal to improve the control ability of gate voltage on the channel conductance. The measurement results indicate acceptable performance of the MOSFET with threshold voltage of 6.01 V. Finally, the MOSFET is serially connected with an LED based on the same platform and the brightness of LED can be effectively controlled by the gate voltage according to the experimental results. Therefore the MOSFET and LED have been fabricated on the same GaN-on-silicon platform, which paves way for the monolithic optical electronic integrated circuit (OEIC).
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