纳米
蚀刻(微加工)
材料科学
硅
各向同性腐蚀
半导体
离子
曲面(拓扑)
反应离子刻蚀
纳米技术
干法蚀刻
化学工程
缩放比例
光电子学
复合材料
化学
图层(电子)
几何学
有机化学
工程类
数学
作者
Dai Ueda,Yousuke Hanawa,Hiroaki Kitagawa,Naozumi Fujiwara,Masayuki Otsuji,Hiroaki Takahashi,Kazuhiro Fukami
出处
期刊:Solid State Phenomena
日期:2021-02-01
卷期号:314: 155-160
被引量:3
标识
DOI:10.4028/www.scientific.net/ssp.314.155
摘要
Wet etching in nanometer-sized three-dimensional spaces creates new challengesbecause of the scaling of semiconductor devices with complex 3D architecture. Wet etching withinspaces is affected by the mass transport of the etchant ions that are impacted by the hydrophobicityand surface potential of surface. However, the kinetics of chemical reactions within the spaces is stillunclear.In this paper, we studied the effect of hydrophobicity and surface potential of silicon surface on SiO2etching in nanometer-sized narrow spaces by adding various additive components to etching solutions.We found that the transport of etchant ions into narrow spaces is governed by controlling thehydrophobicity and surface potential of the confined system walls.
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