黑硅
材料科学
硅
蚀刻(微加工)
反应离子刻蚀
光电子学
晶体硅
反射(计算机编程)
光学
波长
可见光谱
纳米技术
图层(电子)
物理
计算机科学
程序设计语言
作者
G. Kumaravelu,Maan M. Alkaisi,A. Bittar
标识
DOI:10.1109/pvsc.2002.1190507
摘要
Surface texturing is an effective and more lasting technique in reducing reflections and improving light trapping compared to antireflection coatings. A surface texturing technique using reactive ion etching (RIE) method suitable for crystalline and multi crystalline solar cells, which resulted in surfaces with negligible reflection in the visible band is described. Different texturing structures (pillars, holes and black silicon) have been studied and compared in the wavelength range from 250nm-2500nm. It is found that the reflectance of the textured column structures were less than 0.4% at wavelengths from 500 nm to 1000 nm and showed a minimum of 0.29% at 1000 nm while the reflectivity from black silicon is around 1% and hole structures is around 6.8% in the same wavelength range.
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