拉曼散射
显微镜
散射
光学
材料科学
拉曼光谱
X射线拉曼散射
相干反斯托克斯拉曼光谱
激光器
光学显微镜
瞬态(计算机编程)
光电子学
物理
计算机科学
扫描电子显微镜
操作系统
作者
Luca Genchi,Sergey P. Laptenok,Carlo Liberale
标识
DOI:10.1080/23746149.2023.2176258
摘要
Stimulated Raman scattering (SRS) microscopy has gained popularity in recent years due to its linearity to molecule concentration and laser intensity, and to the lack of the nonresonant background that affects its analogous technique, coherent anti-Stokes Raman scattering. However, SRS is not a background-free technique. In fact, there are other optical processes – nonlinear transient scattering and nonlinear transient absorption – that can be detrimental to the contrast and sensitivity of SRS microscopy. In this review, we provide a description of these competing optical processes and present an up-to-date description of current solutions to minimize their effect on SRS measurements.
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