发光
材料科学
晶体缺陷
从头算
激发
半导体
重组
电子
猝灭(荧光)
原子物理学
密度泛函理论
波长
从头算量子化学方法
分子物理学
量子效率
凝聚态物理
光电子学
荧光
物理
光学
计算化学
化学
量子力学
生物化学
分子
基因
作者
Haishan Zhang,Lin Shi,Xiao‐Bao Yang,Yu‐Jun Zhao,Ke Xu,Lin‐Wang Wang
标识
DOI:10.1002/adom.201700404
摘要
Abstract Point defects play an important role in the photoelectrical properties of semiconductor materials, and they can be luminescence centers. However, the relationships among the observed luminescence wavelengths, intensities, and the microscopic processes are in most cases unknown, or depend heavily on parameter fitting. In this work, the light‐emitting quantum efficiencies for point defects using ab initio density functional theory are calculated. The study of radiation recombination for electrons and nonradiation recombination for holes is reported here. The results show that the defect C N transition between “−” and “0” charged levels and the defect C N +O N transition between “0” and “+” charged levels both may be responsible for the yellow luminescence (YL) which is observed in experiment. Moreover, the calculation shows significant thermal quenching of the YL starting at 480 K due to re‐excitation of hole into the valence band from the point defects, which is in relatively good agreement with the experimentally observed value. This work shows that it is possible to use ab initio calculations to understand the microscopic mechanisms and the competitions among different channels for the light emissions caused by defects.
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