欧姆接触
肖特基势垒
材料科学
光电子学
半导体
带隙
工程物理
金属半导体结
肖特基二极管
氮化物
费米能级
宽禁带半导体
凝聚态物理
纳米技术
图层(电子)
物理
电子
二极管
量子力学
出处
期刊:Research & Progress of Solid State Electronics
日期:2004-01-01
摘要
The Schottky barrier and ohmic contacts at metal/Ⅲ-nitride interfaces are the key technology to develop the blue and ultraviolet optical devices and high temperature, high power electronic devices. Ⅲ-nitrides are polar semiconductor with low density of surface states, so that the Fermi level pinning is rather weak and the surface treatments have obvious influence on contact characteristics. The surface contamination and oxidation also deteriorate the contact property. In addition, the high ionization energy of impurity in wide bandgap semiconductors makes difficulties in the raising of density of ionized impurities, and many deep traps may also capture the carriers. All these items increase the degree of difficulty in producing the high-quality contacts, so that it is necessary to find new schemes to improve the contact properties. The physical models to improve these contact properties are summarized in this paper in the hope of providing some new ideas for researchers engaged in devices.
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