铁电性
钙钛矿(结构)
材料科学
同步加速器
纳米
钛酸铅
薄膜
相(物质)
凝聚态物理
纳米技术
光电子学
电介质
光学
结晶学
化学
复合材料
物理
有机化学
作者
Dillon D. Fong,G. B. Stephenson,S. K. Streiffer,J. A. Eastman,O. Auciello,P. H. Fuoss,Carol Thompson
出处
期刊:Science
[American Association for the Advancement of Science (AAAS)]
日期:2004-06-11
卷期号:304 (5677): 1650-1653
被引量:1168
标识
DOI:10.1126/science.1098252
摘要
Understanding the suppression of ferroelectricity in perovskite thin films is a fundamental issue that has remained unresolved for decades. We report a synchrotron x-ray study of lead titanate as a function of temperature and film thickness for films as thin as a single unit cell. At room temperature, the ferroelectric phase is stable for thicknesses down to 3 unit cells (1.2 nanometers). Our results imply that no thickness limit is imposed on practical devices by an intrinsic ferroelectric size effect.
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