过采样
云纹
高分辨率
共发射极
分辨率(逻辑)
计算机科学
材料科学
光学
物理
光电子学
人工智能
遥感
地质学
CMOS芯片
作者
Ingo Rotscholl,U. Krüger,Franz Schmidt
摘要
Evaluation of single emitter‐based display technologies like OLED and μLED at modern display resolutions requires high‐resolution measurements. The typically used oversampling often negatively affect cycle times and ILMD complexity. In this contribution, we present, explain, and validate an alternative to performing high‐resolution measurements despite the Moiré phenomenon.
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