Improving Liquid Film Thickness Uniformity of Semiconductor Etching Equipment Using Flow Field Visualization and CFD Simulation

喷嘴 薄脆饼 蚀刻(微加工) 材料科学 流利 计算流体力学 机械工程 流动可视化 体积流量 工程制图 光电子学 工程类 流量(数学) 机械 纳米技术 航空航天工程 物理 图层(电子)
作者
Tee Lin,Ming-Hsuan Hu,Omid Ali Zargar,Wei-Hao Lai,Graham Leggett
出处
期刊:IEEE Transactions on Semiconductor Manufacturing [Institute of Electrical and Electronics Engineers]
卷期号:35 (2): 332-340 被引量:4
标识
DOI:10.1109/tsm.2022.3147190
摘要

With the rapid development of semiconductor-based products, semiconductor and integrated circuit (IC) design industries have become indicators of global technological advance in this field. As IC structure becomes smaller and smaller, improved process technology and equipment are necessary to maintain and improve wafer yield rates and quality. Among them, the etching technology in the process has a close relationship with the size of IC structure. According to extensive research and analyses put forward by predecessors, the etching process and methods that affect the yield rates and quality of wafers have been well characterized. This study investigates the spray etching method of the single nozzle and double nozzle. Using computational fluid dynamics software developed by Ansys Fluent, the fluid is injected from the center as the starting point at the same flow rate and speed, and according to 2, 4, and 8 seconds of a different cycle and nozzle forms, moving back and forth to supply liquid on the surface of the 300 mm disc. It is assumed that fluid properties do not change with temperature. Additionally, the chemical reaction and thermal reaction of the etching process are not considered. Changes in the surface flow field resulting from different nozzles and cycle conditions are observed. This study involved setting up a set of flow field visualization systems, replacing the etching liquid with colored water, using a digital camera to capture the relationship between the gray index and the thickness of the water film, and calculate the film thickness. The average film thickness deviation ( ${t}_{avg}$ ) and variable quantity ( ${dt}$ ) were characterized and used as a means to compare performance. The results show that the average film thickness deviation of the double nozzles is higher than the single nozzle, and variable quantity ( ${dt}$ ) is lower than that of the single nozzles. In general, the double nozzles increase the thickness and stability of the liquid film thickness on the surface of the disc.

科研通智能强力驱动
Strongly Powered by AbleSci AI
科研通是完全免费的文献互助平台,具备全网最快的应助速度,最高的求助完成率。 对每一个文献求助,科研通都将尽心尽力,给求助人一个满意的交代。
实时播报
lyn123发布了新的文献求助10
刚刚
胡俊豪发布了新的文献求助10
刚刚
刚刚
E1gb完成签到,获得积分10
刚刚
刚刚
李健的粉丝团团长应助CJYY采纳,获得10
1秒前
含糊的紫文完成签到,获得积分10
1秒前
yolo发布了新的文献求助10
1秒前
Wangdx发布了新的文献求助10
1秒前
2秒前
我是老大应助科研爱好者采纳,获得10
2秒前
2秒前
量子星尘发布了新的文献求助10
2秒前
2秒前
桐桐应助能干的元风采纳,获得10
2秒前
Jun完成签到,获得积分10
2秒前
ovo发布了新的文献求助10
3秒前
万能图书馆应助1900tdlemon采纳,获得10
3秒前
DY发布了新的文献求助30
3秒前
zhili发布了新的文献求助10
3秒前
4秒前
阔达的扬完成签到,获得积分10
4秒前
hhh完成签到,获得积分20
4秒前
怡然的向南完成签到,获得积分10
4秒前
孙一斤完成签到,获得积分10
4秒前
4秒前
4秒前
4秒前
量子星尘发布了新的文献求助10
5秒前
jiayou完成签到,获得积分20
5秒前
Ray发布了新的文献求助10
5秒前
含蓄衣完成签到,获得积分20
5秒前
WFLLL应助怀风采纳,获得10
5秒前
星辰大海应助Joyan采纳,获得10
6秒前
6秒前
NexusExplorer应助无线网采纳,获得30
7秒前
安详香水发布了新的文献求助30
7秒前
7秒前
火星上莛发布了新的文献求助10
8秒前
追梦小帅完成签到,获得积分10
8秒前
高分求助中
2025-2031全球及中国金刚石触媒粉行业研究及十五五规划分析报告 12000
(应助此贴封号)【重要!!请各用户(尤其是新用户)详细阅读】【科研通的精品贴汇总】 10000
The Cambridge History of China: Volume 4, Sui and T'ang China, 589–906 AD, Part Two 1000
The Composition and Relative Chronology of Dynasties 16 and 17 in Egypt 1000
Russian Foreign Policy: Change and Continuity 800
Qualitative Data Analysis with NVivo By Jenine Beekhuyzen, Pat Bazeley · 2024 800
Advanced Memory Technology: Functional Materials and Devices 700
热门求助领域 (近24小时)
化学 材料科学 生物 医学 工程类 计算机科学 有机化学 物理 生物化学 纳米技术 复合材料 内科学 化学工程 人工智能 催化作用 遗传学 数学 基因 量子力学 物理化学
热门帖子
关注 科研通微信公众号,转发送积分 5692886
求助须知:如何正确求助?哪些是违规求助? 5090698
关于积分的说明 15210088
捐赠科研通 4850102
什么是DOI,文献DOI怎么找? 2601504
邀请新用户注册赠送积分活动 1553332
关于科研通互助平台的介绍 1511381