光学
微流控
材料科学
干涉测量
显微镜
微通道
镜头(地质)
相(物质)
光学显微镜
显微镜
相位成像
纳米技术
物理
扫描电子显微镜
量子力学
作者
Jaeduck Jang,Chae Yun Bae,Je‐Kyun Park,Jong Chul Ye
出处
期刊:Optics Letters
[The Optical Society]
日期:2010-02-09
卷期号:35 (4): 514-514
被引量:93
摘要
This Letter describes a quantitative phase microscopy for microfluidic devices using a simple self-referencing interferometry. Compared with the gross dimensions of the microfluidic device, the microchannel occupies only a small area of the device. Hence, the reference field can be generated by inverting the relative position of the specimen and background. Our system is realized using an extended depth-of-field optics in the form of Michelson interferometry, which allows quantitative phase measurement for an increased depth-of-field without moving objective lens or specimen. Furthermore, the system can be readily converted to a higher signal-to-noise ratio Hilbert phase microscopy thanks to the simultaneous acquisition of double interferograms. The performance of our system is verified using polymer beads, micropatterning poly(dimethylsiloxane) (PDMS), and embryo cells in the microchannels.
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