聚对苯二甲酸乙二醇酯
材料科学
电阻率和电导率
透射率
蒸发
复合材料
原子力显微镜
基质(水族馆)
光电子学
纳米技术
热力学
海洋学
电气工程
物理
地质学
工程类
作者
Jing Lv,Sheng Ni Zhang
出处
期刊:Advanced Materials Research
日期:2009-08-31
卷期号:79-82: 655-658
被引量:1
标识
DOI:10.4028/www.scientific.net/amr.79-82.655
摘要
A series of Ag films with different thicknesses were prepared on polyethylene terephthalate (PET) substrates under identical conditions by thermal evaporation. The effect of the thickness on the optical and electrical properties of the films was studied. The morphology of the samples was investigated by atomic force microscopy (AFM). The optical and electrical properties were measured by spectrophotometer and four-point probe method, respectively. The experimental results show that the reflectance increases, while transmittance and resistivity decrease with the increase of the thickness. There exists a critical thickness of the film and it is 75 nm in this experiment. The optical and electrical properties of Ag films on PET substrates with thickness larger than critical thickness, are close to those of the conventional bulk silver. The resistivity of the 150-nm film is 3.0±0.2 μΩ•cm, which is lower than that of the 250-nm Ag film grown on BK-7 glass substrates.
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