带隙基准
温度系数
可靠性(半导体)
三极管
电压
电压基准
材料科学
炸薯条
光电子学
带隙
CMOS芯片
晶体管
硅带隙温度传感器
温度测量
电子工程
拓扑(电路)
电气工程
计算机科学
电容器
物理
工程类
跌落电压
功率(物理)
复合材料
量子力学
作者
Yongbo Liao,Zongbo Wang
标识
DOI:10.1109/inec.2016.7589346
摘要
The proposed structure utilizes two transistors to generate a PTAT and a CTAT currents, then sums them up according to certain proportion in the surrounding topological structure of the triodes, finally builds the reference current which is temperature-independent and β-independent. The performance has been verified and consolidated through both simulate and tap-out measurement. The temperature coefficient of the fabricated chip is 17.2ppm V/°C during the temperature from -40°C to +120°C. It is proposed to improve the reliability of the CMOS process bandgap voltage reference circuit.
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