X射线光电子能谱
刚玉
分析化学(期刊)
椭圆偏振法
价(化学)
材料科学
红移
纳米团簇
电介质
吸收光谱法
价电子
薄膜
电子
化学
核磁共振
光学
光电子学
天体物理学
物理
纳米技术
有机化学
色谱法
量子力学
银河系
冶金
作者
Elias Kluth,Michael W. Fay,Christopher Parmenter,Joseph H.T. Roberts,Emily F. Smith,Craig T. Stoppiello,Fabien Massabuau,R. Goldhahn,Martin Feneberg
摘要
Redshift of the absorption onset and amplitude increase in the ultraviolet complex dielectric function (DF) of corundum-like α-(TixGa1−x)2O3 with increasing Ti content is presented. α-Ga2O3 thin film samples alloyed with Ti up to x=0.61 are grown from plasma enhanced atomic layer deposition. They are characterized by ultraviolet spectroscopic ellipsometry, transmission electron microscopy, and x-ray photoelectron spectroscopy (XPS). The samples are shown to be crystalline up to x=0.053. Ellipsometry is employed to obtain the ordinary complex DF, where the absorption onset shows a strong red shift with increasing Ti content as well as an increase in amplitude, which is associated with a successive take over of Ti related 3d-states in the density-of-states. Valence band XPS results lead to the conclusion that the strong red shift in the absorption onset with increasing Ti content is mainly due to conduction band lowering and less from the valence band.
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