Time-resolved x-ray excited optical luminescence spectroscopy: nano-probe investigations of perovskite nanowires

A novel approach of characterizing nano-scaled luminescent materials using time-resolved X-ray excited optical luminescence (TR-XEOL) is presented. With the unique possibility to combine nanoscale spatial and pico-second temporal resolution, we investigate perovskite nanowires with exceptional precision. Integrated X-ray fluorescence spectroscopy in combination with TR-XEOL enables correlating carrier dynamics with material composition at the nanoscale. In this study, we focus on CsPbBr3 nanowires, potential X-ray scintillators, studying the influence of degradation effects on the recombination dynamics. This new experimental approach holds promise for advancing optoelectronic and, especially, nano-photonic materials.