表征(材料科学)
材料科学
纳米技术
电池(电)
显微镜
扫描探针显微镜
光学
物理
量子力学
功率(物理)
作者
Joshua Russell,Paul H. Davis,Corey M. Efaw,Hui Xiong
摘要
Scanning probe microscopy can be used to obtain topographical, mechanical, electrical, and electrochemical information on a wide range of materials in a variety of environments, including in situ and operando studies for rechargeable battery systems.
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