材料科学
扩散
射线照相术
可靠性(半导体)
薄脆饼
计算机科学
工业射线照相
光学
光电子学
物理
复合材料
热力学
功率(物理)
核物理学
材料试验
作者
Jinliang Hu,Sheng Wang,Yuhan Jia,Zhiliang Fang,Fenglan Huang,Jingwei Guo,B. Zhang
摘要
For measuring melt diffusion with in situ and high accuracy, this paper proposes a multi-slice sliding radiography technique. This technique combines the multi-sliding cell technique and x-ray radiography and inherits the advantages of both. It not only visualizes the diffusion process but is also suitable for the diffusion coefficient measurement of systems with low or even no absorption contrast. In addition, by introducing isotopes, self-diffusion and interdiffusion can, in principle, be measured simultaneously with high precision. The details related to the design of this technique and the experiments are reported in this paper. Reliability and validity of this technique are demonstrated by its measurements in Al80Cu20 melt.
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