Development of an Ion Mobility Spectrometer Based on a Pulsed Photoelectric Effect Ionization Source

Ion mobility spectrometry (IMS) is a compact and sensitive trace gas analysis instrument that ionizes the sample into ions for detection. Typically, an ion gate is used to cut the continuous ion beam into ion packets for separation and detection. However, commonly used ion gates suffer from complex structures or low ion transmission rates, making the gateless IMS a viable alternative. In this study, an IMS based on a pulsed photoelectric effect ionization source was designed. The photoelectrons were generated by irradiating a photoelectric material with a back-illuminated pulsed xenon lamp. This allows for low-energy photoelectron generation and the production of simple reactant ions (O