焦平面阵列
光电子学
多光谱图像
材料科学
遥感
光学
线性
光谱分辨率
灵敏度(控制系统)
探测器
碲化镉汞
宽带
图像分辨率
制作
红外线的
光电探测器
太赫兹辐射
基点
物理
光电二极管
工程类
电气工程
电子工程
地质学
天文
谱线
作者
James H. Rutter,Gene Robillard,Charles Robinson,Marion B. Reine,Jeanne M. Hartley,Brian Denley,Robert Minich,Frank W. Adams
出处
期刊:International Symposium on Optical Science and Technology
日期:2000-11-16
摘要
The Engineering Model (EM) and Flight Model (FM) Focal Plane Assembly (FPA)/dewar assemblies have been fabricated, tested, and delivered for system integration, and the EM instrument has been assembled and tested. The key design features of the FPA and dewar have been presented in previous SPIE symposia and will only be briefly reviewed. The primary emphasis in this paper is on the performance results such as sensitivity, linearity and spectral response as well as environmental test results and a review of the assembly of the flight hardware.
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