肖特基二极管
材料科学
光电子学
肖特基势垒
光探测
金属半导体结
光电探测器
热离子发射
二极管
欧姆接触
纳米技术
物理
电子
图层(电子)
量子力学
作者
Meng Dai,Qianqian Wu,Zhong Chen,Xingyu Liu,Xiumei Zhang,Zhengyang Cai,Liangliang Lin,Xiaofeng Gu,Kostya Ostrikov,Haiyan Nan,Shuzhang Xiao
标识
DOI:10.1002/adom.202301900
摘要
Abstract Practical application of two‐dimensional transition metal dichalcogenides (2D TMDCs) involves creating a p‐n diode and a Schottky diode. Unlike p‐n diodes, the research of 2D material‐based Schottky diodes especially in the application field of photodetectors is lacking. Here, a Schottky diode is fabricated by depositing Pt and Ni on the MoS 2 to form Schottky and ohmic contacts, respectively. The MoS 2 Schottky diode exhibits a rectification ratio of 2.36 × 10 3 and an ideality factor of 1.12. The electrical characteristics of Ni‐MoS 2 ‐Ni and Pt‐MoS 2 ‐Pt field effect transistors are systematically compared. The Schottky barrier height is estimated to be 94.2 meV by using the thermionic emission theory. The Schottky diode device can exhibit excellent self‐powered photodetection performance in the visible to near‐infrared region (447‐940 nm) due to the strong built‐in electric field originating from the Schottky barrier at the MoS 2 /Pt interface. The maximum detectivity reaches 2.09 × 10 12 Jones with a response time of 52.6 ms under 940 nm laser illumination. Furthermore, the photodetection performance of such a Schottky diode can be further improved by NH 3 plasma doping treatment. This work provides not only a simple approach to construct a 2D materials‐based Schottky diode photodetector but also a post treatment technique to further improve the device performance.
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