X射线光电子能谱
材料科学
光催化
异质结
量子点
制氢
欧姆接触
氢
光致发光
半导体
纳米技术
化学工程
光化学
催化作用
光电子学
化学
有机化学
工程类
生物化学
图层(电子)
作者
Lun Pan,Jingwen Zhang,Jia Xu,Yuhang Ma,Xiangwen Zhang,Li Wang,Ji‐Jun Zou
出处
期刊:Chinese Journal of Catalysis
[China Science Publishing & Media Ltd.]
日期:2017-02-01
卷期号:38 (2): 253-259
被引量:106
标识
DOI:10.1016/s1872-2067(16)62576-7
摘要
Z-scheme semiconductors are a promising class of photocatalysts for hydrogen generation. In this work, Z-scheme semiconductors composed of WO3–x quantum dots supported on TiO2 (WO3–x QDs/TiO2) were fabricated by solvothermal and hydrogen-reduction methods. Characterization by transmission electron microscopy and X-ray diffraction indicated that the amount and size of the WO3–x QDs could be tuned by modulating the addition of the W precursor. Evidence from X-ray photoelectron spectroscopy and photoluminescence spectroscopy suggested that the hydrogen reduction of the composite induced the formation of oxygen vacancy (W5+/VO) defects in WO3. These defects led to ohmic contact between WO3-x and TiO2, which altered the charge-transfer pathway from type II heterojunction to Z-scheme, and maintained the highly reductive and oxidative ability of TiO2 and WO3–x, respectively. Therefore, the Z-scheme sample showed 1.3-fold higher photoactivity than pure TiO2 in hydrogen generation. These results suggest that the formation of W5+/VO defects at the interface is highly beneficial for the fabrication of Z-scheme photocatalysts.
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