折射率
度量(数据仓库)
功勋
灵敏度(控制系统)
传递矩阵法(光学)
材料科学
切线
光学
光子晶体
耗散因子
质量(理念)
声学
光电子学
电子工程
物理
计算机科学
工程类
数学
电介质
几何学
数据库
量子力学
作者
Bao-Fei Wan,Yi Xu,Ziwei Zhou,Dan Zhang,Haifeng Zhang
出处
期刊:IEEE Sensors Journal
[Institute of Electrical and Electronics Engineers]
日期:2020-09-29
卷期号:21 (3): 2846-2853
被引量:42
标识
DOI:10.1109/jsen.2020.3027759
摘要
In this study, a sensor based on the located defect mode resonance is proposed, which can be used to simultaneously measure changes in magnetic induction intensity, plasma density, refractive index, and incident light angle. Plasma is introduced as the defect into a one-dimensional periodic structure, exciting the located defect mode resonance. The sensitivity, linear range, and figure of merit of the sensor are investigated using the transfer matrix method. The increase in the number of cycles can be used to improve the quality factor and FOM. We also consider the influence of the loss tangent on the sensor to a certain extent. The one-dimensional layered structure is utilized, which has the merits of small volume and simple manufacture. In addition, compared with the traditional sensors design, which focuses on the improvement of performance parameters, our proposed sensor concentrates on the study of multiple physical quantities. Therefore, we hope that our work can have some application potential in the field of measurement.
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