材料科学
光电子学
防反射涂料
薄脆饼
氧化铟锡
硅
异质结
共发射极
太阳能电池
透明导电膜
原子层沉积
涂层
图层(电子)
纳米技术
作者
Muhammad Aleem Zahid,Muhammad Quddamah Khokhar,Somin Park,Shahzada Qamar Hussain,Youngkuk Kim,Junsin Yi
出处
期刊:Vacuum
[Elsevier]
日期:2022-06-01
卷期号:200: 110967-110967
被引量:25
标识
DOI:10.1016/j.vacuum.2022.110967
摘要
Transparent conductive oxide (TCO) thin films play a significant role in silicon heterojunction (SHJ) solar cell and perform both as antireflection coating (ARC) and carrier transport layer. Indium zinc oxide (IZO) films have attracted much attention in opto-electronic industry as an alternative TCO material owing to their superior optical and electrical characteristics as compared to conventionally used indium tin oxide (ITO) films. The optical and electrical properties of IZO films were studied and compared with ITO films. Moreover, the dielectric layer of Al2O3 was deposited on the IZO films using an atomic layer deposition (ALD) system to prepare a double layer antireflection coating (DLARC) structure. The wafer ray tracer simulation tool was used to optimize the thickness of Al2O3/IZO DLARC for SHJ solar cells and experimental results showed its validation. The performance of Al2O3/IZO DLARC on the front surface of rear emitter SHJ solar cell recorded to increase in the current density of 1.37% with enhancement in the efficiency of 0.8%, showing noticeable improvement as compared to cell fabricated with single-layer IZO film.
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