逐次逼近ADC
动态范围
电容器
CMOS芯片
放大器
炸薯条
功勋
高动态范围
奈奎斯特-香农抽样定理
电气工程
奈奎斯特频率
有效位数
电子工程
计算机科学
带宽(计算)
材料科学
工程类
光电子学
电信
电压
作者
Alan Bannon,Christopher Peter Hurrell,Derek Hummerston,C. Lyden
标识
DOI:10.1109/vlsic.2014.6858371
摘要
This paper presents an 18 bit 5 MS/s SAR ADC. It has a dynamic range of 100.2 dB, SNR of 99 dB, INL of ±2 ppm and DNL of ±0.4 ppm. It has currently the lowest noise floor of any monolithic Nyquist converter relative to the full scale input (21.9 nV/√Hz, ±5V full scale) known to the author, all of this is achieved with an ADC core power of 30.52 mW giving a Schreier figure of merit of 179.3 dB [1]. Architectural choices such as the use of a residue amplifier are outlined that enable the high sample rate, low noise and power efficiency. The design is implemented on 0.18 µm CMOS with MIM capacitors and both 1.8 V and 5 V MOS devices. An LVDS interface is used to transfer the ADC result off chip.
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