衍射
X射线
相位恢复
物理
相干衍射成像
X射线光学
波带板
作者
Darren Batey,Frederic Van Assche,Sander Vanheule,Matthieu Boone,Andrew J. Parnell,Oleksandr O. Mykhaylyk,Christoph Rau,Silvia Cipiccia
标识
DOI:10.1103/physrevlett.126.193902
摘要
X-ray ptychography has revolutionised nanoscale phase contrast imaging at large-scale synchrotron sources in recent years. We present here the first successful demonstration of the technique in a small-scale laboratory setting. We conducted an experiment with a liquid metal-jet X-ray source and a single photon-counting detector with a high spectral resolution. The experiment used a spot size of 5 microns to produce a ptychographic phase image of a Siemens star test pattern with a sub-micron spatial resolution. The result and methodology presented show how high-resolution phase contrast imaging can now be performed at small-scale laboratory sources worldwide.
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