发光
材料科学
光电子学
辐射
光子
硅
晶界
太阳能电池理论
太阳能电池
光学
聚合物太阳能电池
物理
复合材料
微观结构
作者
Martin Käsemann,Johannes Giesecke,Wolfram Kwapil,Bernhard Michl,Marco Seeland,Harald Hoppe,Wilhelm Warta
标识
DOI:10.1364/energy.2009.wd4
摘要
Photon emission by solar cells can be used for advanced device diagnostics with imaging techniques. We demonstrate that band-to-band luminescence, heat radiation, dislocation luminescence, and junction-breakdown-related radiation can be used to measure and detect local series resistances, hot-spots, defect-induced junction breakdown, and bulk-, surface- and grain-boundary recombination in silicon solar cells. First measurements of degradation and contamination of polymer solar cells are also presented.
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