X射线光电子能谱
基质(水族馆)
材料科学
溅射沉积
拉曼光谱
分析化学(期刊)
硼硅酸盐玻璃
铜
溅射
电阻率和电导率
薄膜
化学工程
冶金
化学
纳米技术
光学
电气工程
物理
地质学
工程类
海洋学
色谱法
作者
Hongwei Li,Haofei Huang,Azhati Lina,Ke Tang,Zhuorui Chen,Zilong Zhang,Ke Xu,Keke Ding,Linjun Wang,Jian Huang
出处
期刊:Heliyon
[Elsevier]
日期:2023-12-12
卷期号:10 (1): e23349-e23349
被引量:1
标识
DOI:10.1016/j.heliyon.2023.e23349
摘要
Copper-doped Zinc Tellurium (ZnTe:Cu) films were deposited on borosilicate glass using magnetron co-sputtering technique. The influence of the substrate temperature on the structural, morphological, optical and electrical properties of ZnTe:Cu films was investigated by X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), UV–Vis spectrophotometer and Hall effect measurement system. The results indicate that substrate temperature significantly affects the properties of the ZnTe:Cu films. When the substrate temperature increases from room temperature to 600 °C, the (111)-preferred orientation of ZnTe:Cu films is gradually replaced by the (220)-preferred orientation. At high substrate temperatures (≥500 °C), the CuxTe phase appears in the ZnTe:Cu films, resulting in higher carrier concentration (>1019 cm−3) and lower resistivity (<10−2 Ω cm) of the prepared films.
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