MXenes公司
表征(材料科学)
拉曼光谱
X射线光电子能谱
材料科学
纳米技术
最大相位
杠杆(统计)
化学工程
计算机科学
碳化物
工程类
人工智能
光学
冶金
物理
作者
Mikhail Shekhirev,Christopher E. Shuck,Asia Sarycheva,Yury Gogotsi
标识
DOI:10.1016/j.pmatsci.2020.100757
摘要
The MXene field continues to grow and expand as more research groups begin to study this fascinating and very large class of 2D materials. While synthesis and applications of MXenes have been widely discussed in literature, characterization is often overlooked. Due to the large variety of MXene structures and compositions, it is often necessary to use multiple advanced characterization techniques within a single study, and each characterization technique has its own quirks, pitfalls, and benefits when applied to MXenes. This review focuses on the utilization of X-ray diffraction, X-ray photoelectron spectroscopy, Raman spectroscopy, electron microscopy/spectroscopy and a number of other techniques to understand if the precursor (MAX phase) is suitable for MXene synthesis, confirm successful synthesis of MXene, and finally determine its composition, structure and properties. Researchers should look to this review article as a guide to help them understand which techniques to use for characterization of their MXene samples and leverage the best characterization practices developed to date.
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