单层
二硫化钼
薄脆饼
材料科学
蓝宝石
化学气相沉积
半导体
数码产品
光电子学
纳米技术
化学
光学
冶金
物理
物理化学
激光器
作者
Qinqin Wang,Na Li,Jian Tang,Jianqi Zhu,Qinghua Zhang,Qi Jia,Ying Lü,Wei Zheng,Hua Yu,Yanchong Zhao,Yutuo Guo,Lin Gu,Gang Sun,Wei Yang,Rong Yang,Dongxia Shi,Guangyu Zhang
出处
期刊:Nano Letters
[American Chemical Society]
日期:2020-08-24
卷期号:20 (10): 7193-7199
被引量:196
标识
DOI:10.1021/acs.nanolett.0c02531
摘要
Two-dimensional molybdenum disulfide (MoS2) is an emergent semiconductor with great potential in next-generation scaled-up electronics, but the production of high-quality monolayer MoS2 wafers still remains a challenge. Here, we report an epitaxy route toward 4 in. monolayer MoS2 wafers with highly oriented and large domains on sapphire. Benefiting from a multisource design for our chemical vapor deposition setup and the optimization of the growth process, we successfully realized material uniformity across the entire 4 in. wafer and greater than 100 μm domain size on average. These monolayers exhibit the best electronic quality ever reported, as evidenced from our spectroscopic and transport characterizations. Our work moves a step closer to practical applications of monolayer MoS2.
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