吸气剂
放气
杂质
钝化
氩
分析化学(期刊)
氮气
质谱法
加速器质谱
氧气
化学
水分
电离
材料科学
光电子学
环境化学
纳米技术
色谱法
离子
复合材料
有机化学
图层(电子)
作者
Jeffrey L. Briesacher,Masakazu Nakamura,Tadahiro Ohmi
出处
期刊:Journal of The Electrochemical Society
[The Electrochemical Society]
日期:1991-12-01
卷期号:138 (12): 3717-3723
被引量:22
摘要
Impurity levels in the low parts‐per‐trillion (ppt) are possible to measure by atmospheric pressure ionization mass spectrometry. These impurity levels are achieved by the use of getter‐based point‐of‐use purifiers for argon and nitrogen over a wide range of operating conditions, including room temperature operation. At these low impurity levels, the necessity for using ultraclean technology principles, such as all‐metal construction, the elimination of dead zones, and the reduction of outgassing by the use of techniques such as oxygen passivation, is clearly demonstrated, especially to achieve moisture levels near the 100 ppt range.
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