异质结
覆盖层
带偏移量
外延
钝化
光电子学
材料科学
密度泛函理论
半导体
带隙
分子束外延
带材弯曲
化学
电子能带结构
凝聚态物理
纳米技术
计算化学
价带
图层(电子)
物理化学
物理
作者
Jeffrey P. Bosco,Steven Brian Demers,Gregory M. Kimball,Nathan S. Lewis,Harry A. Atwater
摘要
The energy-band alignment of epitaxial zb-ZnS(001)/α-Zn3P2(001) heterojunctions has been determined by measurement of shifts in the phosphorus 2p and sulfur 2p core-level binding energies for various thicknesses (0.6–2.2 nm) of ZnS grown by molecular beam epitaxy on Zn3P2. In addition, the position of the valence-band maximum for bulk ZnS and Zn3P2 films was estimated using density functional theory calculations of the valence-band density-of-states. The heterojunction was observed to be type I, with a valence-band offset, ΔEV, of −1.19 ± 0.07 eV, which is significantly different from the type II alignment based on electron affinities that is predicted by Anderson theory. n+-ZnS/p-Zn3P2 heterojunctions demonstrated open-circuit voltages of >750 mV, indicating passivation of the Zn3P2 surface due to the introduction of the ZnS overlayer. Carrier transport across the heterojunction devices was inhibited by the large conduction-band offset, which resulted in short-circuit current densities of <0.1 mA cm−2 under 1 Sun simulated illumination. Hence, constraints on the current density will likely limit the direct application of the ZnS/Zn3P2 heterojunction to photovoltaics, whereas metal-insulator-semiconductor structures that utilize an intrinsic ZnS insulating layer appear promising.
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