材料科学
光电流
光电子学
光电探测器
可见光谱
响应度
量子点
带隙
半导体
作者
Seungwon Shin,Kwang‐Ho Lee,Jin‐Seong Park,Seong Jun Kang
标识
DOI:10.1021/acsami.5b04683
摘要
Highly transparent phototransistors that can detect visible light have been fabricated by combining indium–gallium–zinc oxide (IGZO) and quantum dots (QDs). A wide-band-gap IGZO film was used as a transparent semiconducting channel, while small-band-gap QDs were adopted to absorb and convert visible light to an electrical signal. Typical IGZO thin-film transistors (TFTs) did not show a photocurrent with illumination of visible light. However, IGZO TFTs decorated with QDs showed enhanced photocurrent upon exposure to visible light. The device showed a responsivity of 1.35 × 104 A/W and an external quantum efficiency of 2.59 × 104 under illumination by a 635 nm laser. The origin of the increased photocurrent in the visible light was the small band gap of the QDs combined with the transparent IGZO films. Therefore, transparent phototransistors based on IGZO and QDs were fabricated and characterized in detail. The result is relevant for the development of highly transparent photodetectors that can detect visible light.
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