光学
折射率对比度
材料科学
散射
折射率
光子晶体
光散射
硅
表面光洁度
波导管
表面粗糙度
光电子学
物理
制作
复合材料
病理
替代医学
医学
作者
Wim Bogaerts,Peter Bienstman,Roel Baets
出处
期刊:Optics Letters
[The Optical Society]
日期:2003-05-01
卷期号:28 (9): 689-689
被引量:75
摘要
We have simulated the effect of sidewall roughness in photonic-crystallike structures with different vertical refractive-index contrast. We treated the scattering off a sidewall irregularity as a radiating dipole excited by the incident waveguide mode. We show that the loss that is due to this scattering is significantly larger for structures with a low refractive-index contrast (such as GaAs/AlGaAs waveguides) than for structures with a high vertical index contrast (such as silicon-on-insulators and membranes).
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