平版印刷术
电子束光刻
小型化
模版印刷
抵抗
材料科学
制作
纳米技术
下一代光刻
X射线光刻
纳米
无光罩微影
光刻
纳米尺度
纳米光刻
计算光刻
阴极射线
光电子学
电子
物理
复合材料
医学
替代医学
图层(电子)
病理
量子力学
作者
Ampere A. Tseng,Kuo‐Shen Chen,C.D. Chen,K. Ma
出处
期刊:IEEE Transactions on Electronics Packaging Manufacturing
[Institute of Electrical and Electronics Engineers]
日期:2003-04-01
卷期号:26 (2): 141-149
被引量:440
标识
DOI:10.1109/tepm.2003.817714
摘要
Miniaturization is the central theme in modern fabrication technology. Many of the components used in modern products are getting smaller and smaller. In this paper, the recent development of the electron beam lithography technique is reviewed with an emphasis on fabricating devices at the nanometer scale. Because of its very short wavelength and reasonable energy density characteristics, e-beam lithography has the ability to fabricate patterns having nanometer feature sizes. As a result, many nanoscale devices have been successfully fabricated by this technique. Following an introduction of this technique, recent developments in processing, tooling, resist, and pattern controlling are separately examined and discussed. Examples of nanodevices made by several different e-beam lithographic schemes are given, to illustrate the versatility and advancement of the e-beam lithography technique. Finally, future trends in this technique are discussed.
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