暗电流
光电二极管
超晶格
光电子学
防反射涂料
基点
材料科学
探测器
光学
大幅面
红外线的
砷化铟
噪音(视频)
像素
光电探测器
量子效率
比探测率
砷化镓
物理
涂层
计算机科学
纳米技术
图像(数学)
人工智能
作者
Pierre-Yves Delaunay,Bình Minh Nguyên,Darin Hoffman,Edward Kwei-wei Huang,Manijeh Razeghi
标识
DOI:10.1109/jqe.2008.2002667
摘要
The recent introduction of a M-structure design improved both the dark current and R 0 A performances of type-II InAs-GaSb photodiodes. A focal plane array fabricated with this design was characterized at 81 K. The dark current of individual pixels was measured between 1.1 and 1.6 nA, 7 times lower than previous superlattice FPAs. This led to a higher dynamic range and longer integration times. The quantum efficiency of detectors without antireflective coating was 74%. The noise equivalent temperature difference reached 23 mK, limited only by the performance of the testing system and the read out integrated circuit. Background limited performances were demonstrated at 81 K for a 300 K background.
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