Anomaly of X-ray Diffraction Profile in Single-Walled Carbon Nanotubes

X-ray diffraction (XRD) studies on single-walled carbon nanotube (SWNT) samples prepared by the arc-discharge method were reported. The XRD profile was basically explained to be a result of triangular packing of SWNTs with a lattice constant of 17.1 Å and an average nanotube radius of 7.1 Å. We found an anomalous change in XRD profiles before and after heat-treatment of the SWNT samples in air at ∼350°C. Combined with gravimetric measurements and resistivity measurements, a detailed simulation of the XRD profiles showed that air (oxygen, and/or nitrogen and/or water) can be condensed inside the SWNTs.